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              Books by Sandip Kundu

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              Nanoscale CMOS VLSI Circuits: Design for Manufacturability

              Nanoscale CMOS VLSI Circuits: Design for Manufacturability (Hardback)

              By Kundu, Sandip; Sreedhar, Aswin

              • RRP: $215.00
              • ONLY $204.25
              • Save $10.75

              Covering defect analysis, equipment, and lithographic control evaluations, this book offers a holistic approach for VLSI circuit designers to evaluate and analyze IC circuit designs from the manufacturability point of view. It is suitable for design engineers, managers, students, ...

              ISBN 9780071635196
              Published 17 June 2010 by McGraw-Hill Education - Europe
              Interest Age 19+ years
              Series Electronics
              Usually ships 4-6 weeks – This is an indent title (internationally sourced to order from a local supplier).
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              Testing and Reliable Design of CMOS Circuits
                

              Testing and Reliable Design of CMOS Circuits (Trade Paperback / Paperback, Softcover reprint of the original 1st ed. 1990)

              By Jha, Niraj K.; Kundu, Sandip

              • OUR PRICE $459.50

              In the last few years CMOS technology has become increas- ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance- ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of ...

              ISBN 9781461288183
              Published 26 September 2011 by Springer Us
              Interest Age General Audience
              Series The Springer International Series in Engineering and Computer Science
              This title is no longer available locally, but in stock internationally – usually ships 2-3 weeks.
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              Testing and Reliable Design of CMOS Circuits
                

              Testing and Reliable Design of CMOS Circuits (Hardback, 1990 ed.)

              By Jha, Niraj K.; Kundu, Sandip

              • OUR PRICE $720.50

              In the last few years CMOS technology has become increas- ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance- ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of ...

              ISBN 9780792390565
              Published 31 December 1989 by Springer Us
              Interest Age 19+ years
              Series The Springer International Series in Engineering and Computer Science
              This title is no longer available locally, but in stock internationally – usually ships 2-3 weeks.
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              Intermittent Failures in Integrated Circuits: Detection, Characterization and Fault Tolerance: 2016
               

              Intermittent Failures in Integrated Circuits: Detection, Characterization and Fault Tolerance: 2016 (Hardback, 2015 ed.)

              By Sanyal, Alodeep; Kundu, Sandip; Polian, Ilia

              • OUR PRICE $424.50

              This book presents a consolidated study of the entire class of intermittent failures, analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault-tolerant design techniques at various levels of abstraction.

              ISBN 9781441983145
              Published 6 January 2016 by Springer-Verlag New York Inc.
              Interest Age General Audience
              Title is showing not yet available from internationally supplier. Ships once internationally released.
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